TEM preparation of quasicrystal-containing alloys using FIB /
Quasicrystals fonn a special state of solid matter beside the crystalline and the amorphous. The positions of the atoms are ordered, but with non-crystallographic rotational symmetries and in a nonperiodic way. However, they possess long-range quasiperiodicity resulting in sharp diffraction spots. T...
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| Format: | Book Chapter |
| Jezik: | English |
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| LEADER | 02284naa a2200265 ib4500 | ||
|---|---|---|---|
| 001 | 9778454 | ||
| 003 | SI-MaCOB | ||
| 005 | 20050830000000.0 | ||
| 008 | 050822s2005 xv |||||||||||||| ||eng c | ||
| 040 | |a KTFMB |b slv |c SI-MaIIZ |d KTFMB |e ppiak | ||
| 080 | |a 620.1/.2 | ||
| 245 | 1 | 0 | |a TEM preparation of quasicrystal-containing alloys using FIB / |c T. Bončina ... [et al.]. |
| 300 | |a Str. 379-380. | ||
| 500 | |a Soavtorji: A. Križman, S. Spaić, B. Markoli, I. Anžel, W. Grogger, F. Zupanič. | ||
| 520 | |a Quasicrystals fonn a special state of solid matter beside the crystalline and the amorphous. The positions of the atoms are ordered, but with non-crystallographic rotational symmetries and in a nonperiodic way. However, they possess long-range quasiperiodicity resulting in sharp diffraction spots. The quasiperiodic structure induces unusual physical properties, promising interesting applications. The quasicrystals are the most reliably characterised with electron diffraction in TEM. Since quasicrystals are nonnally very hard and brittle, preparation of TEM samples using conventional methods may represent problems. Therefore the viable alternative method is using the focused ion beam (FIB) tool, which allows rapid site specific preparation of samples. FIB instruments can be standalone, or used as an attachment to SEM (so called dual beam instruments). Typical FIB instruments use a Ga+ ion beam, which can be used for imaging, cutting... In this work we used FIB for preparing TEM samples of quasicrystalline alloys. Three techniques for manipulating specimens were used: classical H-bar, ex-situ lift-out and in-situ lift-out. | ||
| 653 | 0 | |a presikava materialov |a priprava vzorcev |a elektronska mikroskopija | |
| 653 | 0 | |a materials testing |a sample preparation |a electron microscopy | |
| 700 | 1 | 2 | |a Bončina, Tonica. |4 aut |
| 700 | 1 | 2 | |a Križman, Alojz. |4 aut |
| 700 | 1 | 2 | |a Spaić, Savo. |4 aut |
| 700 | 1 | 2 | |a Markoli, Boštjan. |4 aut |
| 700 | 1 | 2 | |a Anžel, Ivan. |4 aut |
| 700 | 1 | 2 | |a Grogger, W. |4 aut |
| 700 | 1 | 2 | |a Zupanič, Franc. |4 aut |
| 773 | 0 | |a Multinational Congress on Microscopy (7 : 2005 : Portorož) |t Proceedings |d Ljubljana : Slovene Society for Microscopy : Department for Nanostructured Materials, "Jožef Stefan" Institute, 2005 |w 220774144 |z 9616303694 |g Str. 379-380 | |