Comparative study of I-V characteristics of ICB deposited Ag/p-Si(100) AND Ag/n-Si(111) Schottky junctions /

od Cvikl, Bruno., Korošak, Dean., Horvath, Zs. J.

Comparative study of I-IV characteristics of the ICB deposited Ag/n-Si(111) and Ag/p-Si(100) Schottky junctions /

od Cvikl, Bruno., Korošak, Dean., Horváth, Zs.J.

Microscopic origin of excess capacitance of non-ideal Schottky junctions /

od Korošak, Dean., Cvikl, Bruno., Horváth, Zs. J.

Anomalous temperature dependence of series resistance in Ag/Si and Al/Si Schottky junctions /

od Horváth, Zs. J., Ádám, M., Pintér, I., Cvikl, Bruno., Korošak, Dean., Mrdjen, T., Van Tuyen, Vo., Makaró, Zs., Düksö, Cs., Bársony, I.

Vertical electrical properties of AL/SIGE/SI structures /

od Horváth, Zs. J., Jarrendähl, K., Orlov, L.K., Serényi, M., Ádám, M., Szabó, I., Cvikl, Bruno., Korošak, Dean., Pashaev, E., Yakunin, S., Tuyen, V.V., Czigány, Zs.

Proceedings of the First international workshop on semiconductor nanocrystals SEMINANO 2005, September 10-12, 2005, Budapest, Hungary /

Izdano 2005