Greatly improved small inductance measurement using quartz crystal parasitic capacitance compensation /
Generally, quartz crystal inductance frequency pulling in oscillators is very low and therefore is not often used in practice. The new method of improving frequencypullability uses inductance to compensate for quartz stray capacitances. To this end, a special AT fundamental quartz crystal working ne...
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| Format: | Book Chapter |
| Jezik: | English |
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| LEADER | 01571naa a2200229 ib4500 | ||
|---|---|---|---|
| 001 | 14072598 | ||
| 003 | SI-MaCOB | ||
| 005 | 20110121000000.0 | ||
| 008 | 100507s2010 sz ||||f||||||||| ||eng c | ||
| 024 | 7 | 1 | |a 10.3390/s100403954 |2 doi |
| 040 | |a KTFMB |b slv |c SI-MaIIZ |d KTFMB |e ppiak | ||
| 041 | 0 | |a eng |b eng | |
| 080 | |a 681.5 | ||
| 100 | 1 | |a Matko, Vojko. |4 aut | |
| 245 | 0 | 0 | |a Greatly improved small inductance measurement using quartz crystal parasitic capacitance compensation / |c Vojko Matko and Karel Jezernik. |
| 300 | |a str. 3954-3960. | ||
| 504 | |a Bibliografija: str. 3959-3960. | ||
| 504 | |a Abstract. | ||
| 520 | |a Generally, quartz crystal inductance frequency pulling in oscillators is very low and therefore is not often used in practice. The new method of improving frequencypullability uses inductance to compensate for quartz stray capacitances. To this end, a special AT fundamental quartz crystal working near the antiresonance frequency is selected. By modifying its equivalent circuit with load inductance and series tuning capacitance, the magnetic sensing of the circuit can be highly improved. The experimental results show that the new approach using the quartz crystal stray capacitance compensation method increases the frequency pulling range by x 300 depending on the type of oscillator, making possible the measurement of nano-magnetic changes. | ||
| 653 | 0 | |a quartz crystal |a magnetic pulling |a parasitic capacitance compensation | |
| 700 | 1 | 2 | |a Jezernik, Karel. |4 aut |
| 773 | 0 | |t Sensors |d Basel : MDPI, 2001- |x 1424-8220 |g iss. 10, Vol. 4 (2010), str. 3954-3960 | |