An efficient algorithm for digital circuits testing /
With complex integrated circuits implemented either in FPGA or densley packed printed boards the testability problem arises. Since its inception in the mid eighties and its adoption by the IEEE organization as an international standard, boundary-scan technology has rapidly become the technology of c...
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| Format: | Book Chapter |
| Jezik: | English |
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| Sorodne knjige/članki: | Vsebovano v:
Advances in physics, electronics and signal processing applications |
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