An efficient algorithm for digital circuits testing /
With complex integrated circuits implemented either in FPGA or densley packed printed boards the testability problem arises. Since its inception in the mid eighties and its adoption by the IEEE organization as an international standard, boundary-scan technology has rapidly become the technology of c...
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| Glavni avtor: | |
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| Format: | Book Chapter |
| Jezik: | English |
| Teme: | |
| Sorodne knjige/članki: | Vsebovano v:
4th World Multi-Conference on: Circuits, Systems, Communications and Computers, (CSCC 2000) [and] 2nd International Conference on: Mathematics and Computers in Physics (MCP 2000) [and] 2nd International Conference on: Mathematics and Computers in Mechanical Engineerings (MCME 2000) |
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